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Ellipsometry and Polarized Light (North-Holland Personal Library), by R.M.A. Azzam, N.M. Bashara?
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Ellipsometry is a unique optical technique of great sensitivity for in situ non-destructive characterization of surface (inter-facial) phenomena (reactions) utilizing the change in the state of polarization of a light-wave probe. Although known for almost a century, the use of ellipsometry has increased rapidly in the last two decades. Among the most significant recent developments are new applications, novel and automated instrumentation and techniques for error-free data analysis.
This book provides the necessary analytical and experimental tools needed for competent understanding and use of these developments. It is directed to those who are already working in the field and, more importantly, to the newcomer who would otherwise have to sift through several hundred published papers. The authors first present a comprehensive study of the different mathematical representations of polarized light and how such light is processed by optical systems, going on to show how these tools are applied to the analysis of ellipsometer systems. To relate ellipsometric measurements to surface properties, use is then made of electromagnetic theory. Experimental techniques and apparatus are described and the many interesting applications of ellipsometry to surface and thin-film phenomena are reviewed.
This reference work is addressed to researchers and students with a strong interest in surface and thin-film physics and optics and their applications. It is a must for libraries in the fields of solid state physics, physical chemistry, electro-chemistry, metallurgy and optical engineering.
- Sales Rank: #2813797 in Books
- Published on: 1988-08-15
- Original language: English
- Number of items: 1
- Dimensions: 9.00" h x 6.00" w x 1.00" l,
- Binding: Paperback
- 558 pages
Review
(The authors) are to be commended on the further, major contribution to polarized light and its applications represented by this excellent book.
Physics Today
This book is carefully done... a serious and thorough effort that can be recommended to the expert in the field and the newcomer.
Applied Optics
Most helpful customer reviews
2 of 2 people found the following review helpful.
A useful book for material scientists
By L. Lavagnino
In the last years ellipsometry has gained an important place in material science, due to the possibility of measuring optical properties of materials.
In this book the authors give a complete overview of this technique, starting from the principles of polarized light up to a deep threatment of ellipsometry (theory and applications) and its unique features in the field of surface and thin films phenomena.
A book that must be in a serious library of solid state physics, optics and physical chemistry.
4 of 5 people found the following review helpful.
Unique in its kind
By schaieb@lauca.usach.cl
This book is a very good guide of how to use ellipsometry to probe interfaces and thin films (one can measure film thicknesses with an outstanding resolution). It shows that the simple fact that a change in the polarization of light can be a good probe for several systems (such as film growth and liquid-liquid interfaces). I would have liked however, if there were some information of how one can measure mechanical properties of a thin fluctuating liquid film using phase modulated ellipsometry.
I liked the book and is my bible whenever I want to do such experiments.
4 of 8 people found the following review helpful.
The polarized light classic
By A Customer
Very good treatment of polarimeters, polarization calculii, and thin films. Solid mathematical treatment. Good for students
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